Analysis of reliability index R=P(Y<X) for newly extended xgamma progressively first-failure censored samples with applications
The stress-strength index measures the likelihood that a system's strength exceeds its stress. This study focuses on deducting the stress-strength index, denoted as $ \mathfrak{R} = P(Y < X) $, where the strength $ (X) $ and stress $ (Y) $ are independent random variables following new e...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIMS Press
2024-11-01
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| Series: | AIMS Mathematics |
| Subjects: | |
| Online Access: | https://www.aimspress.com/article/doi/10.3934/math.20241546?viewType=HTML |
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