Analysis of reliability index R=P(Y<X) for newly extended xgamma progressively first-failure censored samples with applications

Analysis of reliability index R=P(Y<X) for newly extended xgamma progressively first-failure censored samples with applications

The stress-strength index measures the likelihood that a system's strength exceeds its stress. This study focuses on deducting the stress-strength index, denoted as $ \mathfrak{R} = P(Y &lt; X) $, where the strength $ (X) $ and stress $ (Y) $ are independent random variables following new e...

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Bibliographic Details
Main Authors: Refah Alotaibi, Mazen Nassar, Zareen A. Khan, Ahmed Elshahhat
Format: Article
Language:English
Published: AIMS Press 2024-11-01
Series:AIMS Mathematics
Subjects:
extended xgamma distribution
stress strength index
classical estimation
squared error loss function
bayesian estimation
Online Access:https://www.aimspress.com/article/doi/10.3934/math.20241546?viewType=HTML
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