Deep knowledge tracing and cognitive load estimation for personalized learning path generation using neural network architecture

Abstract This paper presents a novel approach for personalized learning path generation by integrating deep knowledge tracing and cognitive load estimation within a unified framework. We propose a dual-stream neural network architecture that simultaneously models students’ knowledge states and cogni...

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Bibliographic Details
Main Authors: Chunyan Tong, Changhong Ren
Format: Article
Language:English
Published: Nature Portfolio 2025-07-01
Series:Scientific Reports
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Online Access:https://doi.org/10.1038/s41598-025-10497-x
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Summary:Abstract This paper presents a novel approach for personalized learning path generation by integrating deep knowledge tracing and cognitive load estimation within a unified framework. We propose a dual-stream neural network architecture that simultaneously models students’ knowledge states and cognitive load levels to optimize learning trajectories. The knowledge state tracking module employs a bidirectional Transformer with graph attention mechanisms to capture complex relationships between knowledge components, while the cognitive load estimation module utilizes multimodal data analysis to dynamically assess mental effort during learning activities. A dual-objective optimization algorithm balances knowledge acquisition with cognitive load management to generate paths that maintain optimal challenge levels. Experimental evaluations across multiple educational domains demonstrate that our approach outperforms existing methods in prediction accuracy (87.5%), path quality (4.4/5), and learning efficiency (24.6% improvement). The implemented system supports real-time adaptation based on performance and cognitive state, resulting in reduced frustration, higher engagement, and improved knowledge retention. This research contributes to both theoretical understanding of learning processes and practical implementation of next-generation adaptive educational technologies.
ISSN:2045-2322