Cross-Project Defect Prediction Using Transfer Learning with Long Short-Term Memory Networks
With the increasing number of software projects, within-project defect prediction (WPDP) has already been unable to meet the demand, and cross-project defect prediction (CPDP) is playing an increasingly significant role in the area of software engineering. The classic CPDP methods mainly concentrate...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2024-01-01
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| Series: | IET Software |
| Online Access: | http://dx.doi.org/10.1049/2024/5550801 |
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