Enhanced Reliability and Self‐Compliance of Synaptic Arrays for Multibit Encoded Neuromorphic Systems
Abstract Utilizing memristors to increase the density of crossbar arrays requires reducing dependency on transistors. This paper presents an approach where the current limiting function is integrated within the memristor by inducing an AlOx/TaOx layer, thereby limiting overshoot current during filam...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2025-02-01
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| Series: | Advanced Electronic Materials |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/aelm.202400282 |
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