Rapid analysis of temperature fields in electronic enclosures based on the finite difference thermal resistance network method

With the accelerated pace of functional updates and iteration in electronic enclosures design, the thermal design cycle is continuously shortened. However, the computational process of numerical simulation methods based on the finite element method (FEM) and finite volume method (FVM) is time-consum...

Full description

Saved in:
Bibliographic Details
Main Authors: Xiaoyue Zhang, Yinmo Xie, Bing Liu, Yingze Meng, Kewei Sun, Guangsheng Wu, Jianyu Tan
Format: Article
Language:English
Published: Elsevier 2025-01-01
Series:Case Studies in Thermal Engineering
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2214157X24016824
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items