BEACON—automated aberration correction for scanning transmission electron microscopy using Bayesian optimization

BEACON—automated aberration correction for scanning transmission electron microscopy using Bayesian optimization

Abstract Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without interrupting on-going experiments. Here,...

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Main Authors: Alexander J. Pattison, Stephanie M. Ribet, Marcus M. Noack, Georgios Varnavides, Kunwoo Park, Earl J. Kirkland, Jungwon Park, Colin Ophus, Peter Ercius
Format: Article
Language:English
Published: Nature Portfolio 2025-08-01
Series:npj Computational Materials
Online Access:https://doi.org/10.1038/s41524-025-01766-4
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https://doi.org/10.1038/s41524-025-01766-4

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