Direct Current to Digital Converter (DIDC): A Current Sensor

Direct Current to Digital Converter (DIDC): A Current Sensor

This paper introduces a systematic approach to the design of Direct Current-to-Digital Converter (DIDC) specifically engineered to overcome the limitations of traditional current measurement methodologies in System-on-Chip (SoC) designs. The proposed DIDC addresses critical challenges such as high p...

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Bibliographic Details
Main Authors: Saeid Karimpour, Michael Sekyere, Isaac Bruce, Emmanuel Nti Darko, Degang Chen, Colin C. McAndrew, Doug Garrity, Xiankun Jin, Ilhan Hatirnaz, Chen He
Format: Article
Language:English
Published: MDPI AG 2024-10-01
Series:Sensors
Subjects:
reliability
measurement
ADC
DIDC
CMOS
VLSI
Online Access:https://www.mdpi.com/1424-8220/24/21/6789
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Summary:This paper introduces a systematic approach to the design of Direct Current-to-Digital Converter (DIDC) specifically engineered to overcome the limitations of traditional current measurement methodologies in System-on-Chip (SoC) designs. The proposed DIDC addresses critical challenges such as high power consumption, large area requirements, and the need for intermediate analog signals. By incorporating a current mirror in a cascode topology and managing the current across multiple binary-sized branches with the Successive Approximation Register (SAR) logic, the design achieves precise current measurement. A simple comparator, coupled with an isolation circuit, ensures accurate and reliable sensing. Fabricated using the TSMC 180 nm process, the DIDC achieves 8-bit precision without the need for nonlinearity calibration, showcasing remarkable energy efficiency with an energy per conversion of 1.52 pJ, power consumption of 117 µW, and a compact area of 0.016 mm². This innovative approach not only reduces power consumption and area, but also provides a scalable and efficient solution for next-generation semiconductor technologies. The ability to conduct online measurements during both standard operations and in-field conditions significantly enhances the performance and reliability of SoCs, making this DIDC a promising advancement in the field.
ISSN:1424-8220

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