Hard X-ray single-shot spectrometer of PAL-XFEL
A transmissive single-shot spectrometer has been developed to monitor shot-to-shot spectral structures in the hard X-ray beamline of the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). The established spectrometer comprises 10 µm-thick Si crystals bent to a radius of curvature of...
Saved in:
Main Authors: | Sangsoo Kim, Jae Hyuk Lee, Daewoong Nam, Gisu Park, Myong-jin Kim, Intae Eom, Inhyuk Nam, Chi Hyun Shim, Jangwoo Kim |
---|---|
Format: | Article |
Language: | English |
Published: |
International Union of Crystallography
2025-01-01
|
Series: | Journal of Synchrotron Radiation |
Subjects: | |
Online Access: | https://journals.iucr.org/paper?S1600577524009779 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Development of MHz X-ray phase contrast imaging at the European XFEL
by: Jayanath C. P. Koliyadu, et al.
Published: (2025-01-01) -
The Heisenberg-RIXS instrument at the European XFEL
by: Justine Schlappa, et al.
Published: (2025-01-01) -
Diffuse Reflectance Spectrophotometers Based on C12880MA and C11708MA Mini-Spectrometers Hamamatsu
by: V. A. Firago, et al.
Published: (2022-07-01) -
Méditations sur le « Paradoxe Pulp » : Pal, la Paramount et les pulps de SF
by: Jay P. Telotte
Published: (2023-12-01) -
Prism-Based Spatial Heterodyne Spectrometer with a Fixed Fringe Localization Plane
by: Zihao Liu, et al.
Published: (2025-01-01)