Investigation of X-ray radiation response to electrical properties of Mo/Cu(In0.7Ga0.3)Te2/p-Si/Al semiconductor diode
Diodes are exposed to radiation in many operating environments, and it is important to investigate the radiation effect. In this study, the impact of X-ray radiation on the electrical properties of Mo/Cu(In0.7Ga0.3)Te2/p-Si/Al semiconductor diode was explored by I-V measurements performed before and...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Tokat Gaziosmanpasa University
2023-12-01
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| Series: | Journal of New Results in Science |
| Subjects: | |
| Online Access: | https://dergipark.org.tr/en/download/article-file/3416221 |
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