A Pseudo-Labeling Multi-Screening-Based Semi-Supervised Learning Method for Few-Shot Fault Diagnosis
In few-shot fault diagnosis tasks in which the effective label samples are scarce, the existing semi-supervised learning (SSL)-based methods have obtained impressive results. However, in industry, some low-quality label samples are hidden in the collected dataset, which can cause a serious shift in...
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Main Authors: | Shiya Liu, Zheshuai Zhu, Zibin Chen, Jun He, Xingda Chen, Zhiwen Chen |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2024-10-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/24/21/6907 |
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