A Pseudo-Labeling Multi-Screening-Based Semi-Supervised Learning Method for Few-Shot Fault Diagnosis

In few-shot fault diagnosis tasks in which the effective label samples are scarce, the existing semi-supervised learning (SSL)-based methods have obtained impressive results. However, in industry, some low-quality label samples are hidden in the collected dataset, which can cause a serious shift in...

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Bibliographic Details
Main Authors: Shiya Liu, Zheshuai Zhu, Zibin Chen, Jun He, Xingda Chen, Zhiwen Chen
Format: Article
Language:English
Published: MDPI AG 2024-10-01
Series:Sensors
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Online Access:https://www.mdpi.com/1424-8220/24/21/6907
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