Contactless defects detection using modulated photoluminescence technique: model for a single Shockley-Read-Hall trap in a semiconductor thin layer
Studying defects in semiconductors is, in practice, a very important topic for opto-electronic applications. It involves advanced characterization tools able to quantify and qualify the defect densities present in the materials. In the present article we focus on the use of a contactless frequency d...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2025-01-01
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| Series: | EPJ Photovoltaics |
| Subjects: | |
| Online Access: | https://www.epj-pv.org/articles/epjpv/full_html/2025/01/pv20240060/pv20240060.html |
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