INTERVAL FORECAST OF DEGRADATION OF ELECTRICAL PARAMETER FOR ELECTRONIC DEVICES
In individual forecasting of parameter values and, therefore, gradual refuses of electronic devices' (ED) with simulation effects method the reliability prediction can be judged by average prediction error, which gives only average reliability prediction picture. In particular cases parameter&#...
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| Main Author: | |
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| Format: | Article |
| Language: | Russian |
| Published: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/232 |
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