Reliability Assessment of Optical Physical Unclonable Functions Based on the Spatial Distribution of Catastrophic Failure Sites in MIM Structures
Catastrophic failure sites, also referred to as breakdown spots, in Metal-Insulator-Semiconductor (MIS) and Metal-Insulator-Metal (MIM) structures are the consequence of the formation of conducting paths across the thin oxide film that separates the contact electrodes. When the energy released by th...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10891387/ |
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