Material Segmentation Using 1-D Convolutional Neural Network With Transient Histogram

Material Segmentation Using 1-D Convolutional Neural Network With Transient Histogram

This study introduces a method for material classification using transient histograms obtained via a single-photon avalanche diode (SPAD) sensor. Temporal resolution in optical sensing plays a crucial role in material classification and surface segmentation, particularly for distinguishing materials...

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Bibliographic Details
Main Authors: Yohanssen Pratama, Kazuya Kitano, Takahiro Kushida, Yuki Fujimura, Takuya Funatomi, Yasuhiro Mukaigawa
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Material classification
single photon avalanche diode
surface segmentation
temporal resolution
transient histogram
1-D convolutional neural network
Online Access:https://ieeexplore.ieee.org/document/10942358/
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https://ieeexplore.ieee.org/document/10942358/

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