LG = 50 nm T-gated and Fe-doped double quantum well GaN‒HEMT on SiC wafer with graded AlGaN barrier for future power electronics applications

High-performance LG = 50 nm graded double-channel (GDC)-HEMT featuring AlN top barrier, recessed T-gate and graded-AlGaN bottom barrier is designed and investigated. Two quantum wells are formed in the AlN-GaN-graded AlGaN-GaN multilayer structure developed on a SiC substrate and the clear double hu...

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Bibliographic Details
Main Authors: B. Mounika, J. Ajayan, Sandip Bhattacharya, D. Nirmal, Amit Krishna Dwivedi
Format: Article
Language:English
Published: Elsevier 2024-12-01
Series:Journal of Science: Advanced Materials and Devices
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Online Access:http://www.sciencedirect.com/science/article/pii/S2468217924001266
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