An Investigation of Minimum Supply Voltage of 5-nm SRAM From 300 K Down to 10 K
In this article, we present a comprehensive study of the impact of cryogenic temperatures on the minimum operating voltage (<inline-formula> <tex-math notation="LaTeX">$V_{\min }$ </tex-math></inline-formula>) of 5-nm Fin Field-Effect Transistors (FinFETs)-based Sta...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Journal on Exploratory Solid-State Computational Devices and Circuits |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10963695/ |
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