An Investigation of Minimum Supply Voltage of 5-nm SRAM From 300 K Down to 10 K

In this article, we present a comprehensive study of the impact of cryogenic temperatures on the minimum operating voltage (<inline-formula> <tex-math notation="LaTeX">$V_{\min }$ </tex-math></inline-formula>) of 5-nm Fin Field-Effect Transistors (FinFETs)-based Sta...

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Bibliographic Details
Main Authors: Hafeez Raza, Shivendra Singh Parihar, Yogesh Singh Chauhan, Hussam Amrouch, Avinash Lahgere
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10963695/
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