Surge current management in Dynamic Reverse Bias reliability testing of WBG devices for automotive application

Surge current management in Dynamic Reverse Bias reliability testing of WBG devices for automotive application

Efficient management of high-magnitude current spikes during Dynamic Reverse Bias (DRB) reliability testing is critical for early detection of potential issues such as gate oxide degradation in wide bandgap (WBG) devices. This paper addresses the challenges of DRB testing, particularly focusing on c...

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Bibliographic Details
Main Authors: Abdul Haleem Malik, Mohammed Amer Karout, Haiyong Wan, Jose Ortiz Gonzalez, Philip Mawby, M. Taha
Format: Article
Language:English
Published: Elsevier 2024-12-01
Series:Power Electronic Devices and Components
Subjects:
DRB
Surge current
Voltage spikes
Leakage current
Parasitic elements
Fast switching
Online Access:http://www.sciencedirect.com/science/article/pii/S2772370424000154
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