Surge current management in Dynamic Reverse Bias reliability testing of WBG devices for automotive application
Efficient management of high-magnitude current spikes during Dynamic Reverse Bias (DRB) reliability testing is critical for early detection of potential issues such as gate oxide degradation in wide bandgap (WBG) devices. This paper addresses the challenges of DRB testing, particularly focusing on c...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2024-12-01
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| Series: | Power Electronic Devices and Components |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2772370424000154 |
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