Malik, A. H., Karout, M. A., Wan, H., Gonzalez, J. O., Mawby, P., & Taha, M. Surge current management in Dynamic Reverse Bias reliability testing of WBG devices for automotive application. Elsevier.
Chicago Style (17th ed.) CitationMalik, Abdul Haleem, Mohammed Amer Karout, Haiyong Wan, Jose Ortiz Gonzalez, Philip Mawby, and M. Taha. Surge Current Management in Dynamic Reverse Bias Reliability Testing of WBG Devices for Automotive Application. Elsevier.
MLA (9th ed.) CitationMalik, Abdul Haleem, et al. Surge Current Management in Dynamic Reverse Bias Reliability Testing of WBG Devices for Automotive Application. Elsevier.
Warning: These citations may not always be 100% accurate.
       
       