Insights Into Threshold Voltage Variability in Negative Capacitance Junctionless Transistor
This work investigates the statistical variability of threshold voltage <inline-formula> <tex-math notation="LaTeX">$(\sigma V_{\mathrm { th}})$ </tex-math></inline-formula> and its sensitivity to critical geometrical parameters in negative capacitance (NC) junction...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10766418/ |
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