Comprehensive analysis of faults and diagnosis techniques in cascaded multi-level inverters

Comprehensive analysis of faults and diagnosis techniques in cascaded multi-level inverters

Reliability is a crucial factor to consider for multi-level inverters (MLIs) used in industrial applications. With the increasing number of power semiconductor devices, the potential for defects to significantly degrade the overall system is heightened. A highly effective fault-detection technique i...

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Bibliographic Details
Main Authors: Ranjith Kumar Gatla, Devineni Gireesh Kumar, Palthur Shashavali, Rao Dsnm, Hossam Kotb, Abdulaziz Alkuhayli, Yazeed Yasin Ghadi, Wulfran Fendzi Mbasso
Format: Article
Language:English
Published: Elsevier 2024-11-01
Series:Heliyon
Subjects:
Multi-level inverters
Fault detection
Total harmonic distortion
Open-loop and closed-loop systems
Online Access:http://www.sciencedirect.com/science/article/pii/S2405844024159324
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