Far-Field Testing Method of Spurious Emission Produced by HF RFID
We present measurements of spurious emission produced by high-frequency radio frequency identification (HF RFID) using carrier frequency of 13.56 MHz. HF RFID tags produce unwanted emission due to rectification and more generally due to nonlinearity of analog front end. Depending on the conducting m...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2016-01-01
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| Series: | International Journal of Antennas and Propagation |
| Online Access: | http://dx.doi.org/10.1155/2016/4715898 |
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