Overview of Key Techniques for In Situ Tests of Electromagnetic Radiation Emission Characteristics
With the growing number of electronic devices loaded and increasing influence from electromagnetic interference, large-scale systems or platforms are confronted with increasingly severe electromagnetic compatibility challenges. Due to the vast size of these systems and the multitude of electronic de...
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Main Authors: | Zhonghao Lu, Yan Chen, Yunxiao Xue |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2024-11-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/24/23/7515 |
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