Overview of Key Techniques for In Situ Tests of Electromagnetic Radiation Emission Characteristics

With the growing number of electronic devices loaded and increasing influence from electromagnetic interference, large-scale systems or platforms are confronted with increasingly severe electromagnetic compatibility challenges. Due to the vast size of these systems and the multitude of electronic de...

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Bibliographic Details
Main Authors: Zhonghao Lu, Yan Chen, Yunxiao Xue
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/24/23/7515
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