Controlled random tests with limited Hamming distance

Controlled random tests with limited Hamming distance

Objectives. The problem of constructing controlled random tests with a fixed minimum Hamming distance is solved. The limitations of classical approaches to generating test patterns based on enumeration of test pattern candidates are shown. With an increase in the threshold values of the difference m...

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Bibliographic Details
Main Authors: V. N. Yarmolik, V. V. Petrovskaya, D. V. Demenkovets, V. A. Levantsevich
Format: Article
Language:Russian
Published: National Academy of Sciences of Belarus, the United Institute of Informatics Problems 2025-03-01
Series:Informatika
Subjects:
test diagnostics
controlled random tests
binary test patterns
character patterns difference measure
hamming distance
pattern-sensitive faults
Online Access:https://inf.grid.by/jour/article/view/1316
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