Semantic Segmentation of Corn Leaf Blotch Disease Images Based on U-Net Integrated with RFB Structure and Dual Attention Mechanism

Northern corn leaf blight (NCLB) is caused by a fungus and can be susceptible to the disease throughout the growing period of corn, posing a significant impact on corn yield. Aiming at the problems of under-segmentation, over-segmentation, and low segmentation accuracy in the traditional segmentatio...

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Bibliographic Details
Main Authors: Ye Mu, Ke Li, Yu Sun, Yu Bao
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Agronomy
Subjects:
Online Access:https://www.mdpi.com/2073-4395/14/11/2652
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