TOPOLOGICAL IMAGE PROCESSING FOR COMPREHENSIVE DEFECT AND DEVIATION ANALYSIS USING ADAPTIVE BINARISATION
The subject of this article is the preparation for recognition and comparison of real topological images of printed circuit boards (PCBs) using adaptive image binarisation with an "automatic window" (the area for scanning the image "Block size"). The aim of the work is to improv...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Kharkiv National University of Radio Electronics
2023-03-01
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| Series: | Сучасний стан наукових досліджень та технологій в промисловості |
| Subjects: | |
| Online Access: | https://itssi-journal.com/index.php/ittsi/article/view/377 |
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