Protonation‐Driven Polarization Retention Failure in Nano‐Columnar Lead‐Free Ferroelectric Thin Films

Protonation‐Driven Polarization Retention Failure in Nano‐Columnar Lead‐Free Ferroelectric Thin Films

Abstract Understanding microscopic mechanisms of polarization retention characteristics in ferroelectric thin films is of great significance for exploring unusual physical phenomena inaccessible in the bulk counterparts and for realizing thin‐film‐based functional electronic devices. Perovskite (K,N...

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Main Authors: Muhammad Sheeraz, Chang Won Ahn, Nguyen Xuan Duong, Soo‐Yoon Hwang, Ji‐Soo Jang, Eun‐Young Kim, Yoon Ki Kim, Jaeyeong Lee, Jong Sung Jin, Jong‐Seong Bae, Myang Hwan Lee, Hyoung‐Su Han, Gi‐Yeop Kim, Shinuk Cho, Tae Kwon Song, Sang Mo Yang, Sang Don Bu, Seung‐Hyub Baek, Si‐Young Choi, Ill Won Kim, Tae Heon Kim
Format: Article
Language:English
Published: Wiley 2024-12-01
Series:Advanced Science
Subjects:
ferroelectric
(K,Na)NbO3
thin film
polarization retention loss
epitaxy
Online Access:https://doi.org/10.1002/advs.202408784
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https://doi.org/10.1002/advs.202408784

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