Structural and optical properties of Eu-doped ZnO epitaxial thin films grown by pulsed-laser deposition

Pulsed-laser deposition was utilized to fabricate Eu-doped ZnO epitaxial films on c-plane sapphire substrates with Eu concentrations ranging from 0.5 to 4.0 at. %. The structural properties were analyzed using x-ray diffraction surface normal radial scans and azimuthal cone scans, which confirmed th...

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Bibliographic Details
Main Authors: Wei-Lun Wei, Chun-Yen Lin, Tzu-Chi Huang, Yi-Chen Li, Yu-Hao Wu, Chien-Yu Lee, Bo-Yi Chen, Gung-Chian Yin, Mau-Tsu Tang, Wu-Ching Chou, Fang-Yuh Lo, Bi-Hsuan Lin
Format: Article
Language:English
Published: AIP Publishing LLC 2024-11-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0234509
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