Model-Based Variation-Aware Optimization for Offset Calibration and Pre-Sensing in DRAM Sense Amplifiers

Model-Based Variation-Aware Optimization for Offset Calibration and Pre-Sensing in DRAM Sense Amplifiers

This article proposes a new mathematical model that accurately predicts statistical margin characteristics of bit-line sense amplifiers (BLSAs) with offset calibration (OC) and pre-sensing (PS), while providing techniques to improve sensing margins. In particular, threshold voltage mismatch caused b...

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Bibliographic Details
Main Authors: Dongyeong Kim, Geon Kim, Suyeon Kim, Jewon Park, Sinwook Kim, Hyeona Seo, Chaehyuk Lim, Sowon Kim, Juwon Lee, Jeonghyeon Yun, Hyerin Lee, Jinseok Park, Yongbok Lee, Seungchan Lee, Myoungjin Lee
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
DRAM
sense amplifier
low voltage
mismatch
sensing offset
Online Access:https://ieeexplore.ieee.org/document/10843701/
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