Advances and challenges in dynamic photo-induced force microscopy
Abstract Photo-induced force microscopy (PiFM) represents a scanning probe technique renowned for its ability to provide high-resolution spectroscopic imaging at the nanoscale. It capitalizes on the amplification of tip motion by photo-induced forces, which are influenced by the response of the loca...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Springer
2024-11-01
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| Series: | Discover Nano |
| Subjects: | |
| Online Access: | https://doi.org/10.1186/s11671-024-04150-1 |
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