Coherence and statistical insights for low electron count regimes in transmission electron microscopy
Abstract We investigate coherent diffraction patterns from an amorphous SiO $$_2$$ 2 across a range of electron counting regimes, from sparse single-event detection to cumulative high-flux exposures. Low electron count rates, with a mean of approximately 0.017 electrons per pixel, reveal discrete el...
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2025-07-01
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| Series: | Journal of Analytical Science and Technology |
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| Online Access: | https://doi.org/10.1186/s40543-025-00503-2 |
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| author | Joohyun Lee Ji-Hwan Kwon Sooheyong Lee |
| author_facet | Joohyun Lee Ji-Hwan Kwon Sooheyong Lee |
| author_sort | Joohyun Lee |
| collection | DOAJ |
| description | Abstract We investigate coherent diffraction patterns from an amorphous SiO $$_2$$ 2 across a range of electron counting regimes, from sparse single-event detection to cumulative high-flux exposures. Low electron count rates, with a mean of approximately 0.017 electrons per pixel, reveal discrete electron events dominated by shot noise. In contrast, cumulative patterns acquired over 60 s exhibit pronounced speckle features reflecting atomic arrangements in the material. The count contrast $$C_k$$ C k as a function of mean electron count $$\overline{K}$$ K ¯ transitions from a Poisson-dominated $$1/\sqrt{ \overline{K} }$$ 1 / K ¯ trend at low $$\overline{K}$$ K ¯ to a stabilized $$C_k = 0.23$$ C k = 0.23 beyond $$\overline{K} = 10$$ K ¯ = 10 , of which behavior is modeled effectively with a spatial degree of freedom $$M = 32$$ M = 32 . This M value indicates partially coherent illumination, deviating from single-mode expectations of the electron beam. Our finding bridges a gap between statistical optics and applied TEM and introduces a framework with direct practical relevance for modern detector technologies. |
| format | Article |
| id | doaj-art-5f9f0f4b76c04265b00560664fe06d50 |
| institution | Kabale University |
| issn | 2093-3371 |
| language | English |
| publishDate | 2025-07-01 |
| publisher | SpringerOpen |
| record_format | Article |
| series | Journal of Analytical Science and Technology |
| spelling | doaj-art-5f9f0f4b76c04265b00560664fe06d502025-08-20T04:02:57ZengSpringerOpenJournal of Analytical Science and Technology2093-33712025-07-011611910.1186/s40543-025-00503-2Coherence and statistical insights for low electron count regimes in transmission electron microscopyJoohyun Lee0Ji-Hwan Kwon1Sooheyong Lee2Korea Research Institute of Standards and ScienceKorea Research Institute of Standards and ScienceKorea Research Institute of Standards and ScienceAbstract We investigate coherent diffraction patterns from an amorphous SiO $$_2$$ 2 across a range of electron counting regimes, from sparse single-event detection to cumulative high-flux exposures. Low electron count rates, with a mean of approximately 0.017 electrons per pixel, reveal discrete electron events dominated by shot noise. In contrast, cumulative patterns acquired over 60 s exhibit pronounced speckle features reflecting atomic arrangements in the material. The count contrast $$C_k$$ C k as a function of mean electron count $$\overline{K}$$ K ¯ transitions from a Poisson-dominated $$1/\sqrt{ \overline{K} }$$ 1 / K ¯ trend at low $$\overline{K}$$ K ¯ to a stabilized $$C_k = 0.23$$ C k = 0.23 beyond $$\overline{K} = 10$$ K ¯ = 10 , of which behavior is modeled effectively with a spatial degree of freedom $$M = 32$$ M = 32 . This M value indicates partially coherent illumination, deviating from single-mode expectations of the electron beam. Our finding bridges a gap between statistical optics and applied TEM and introduces a framework with direct practical relevance for modern detector technologies.https://doi.org/10.1186/s40543-025-00503-2Transmission electron microscopeSpeckleCoherent diffractionLow dose |
| spellingShingle | Joohyun Lee Ji-Hwan Kwon Sooheyong Lee Coherence and statistical insights for low electron count regimes in transmission electron microscopy Journal of Analytical Science and Technology Transmission electron microscope Speckle Coherent diffraction Low dose |
| title | Coherence and statistical insights for low electron count regimes in transmission electron microscopy |
| title_full | Coherence and statistical insights for low electron count regimes in transmission electron microscopy |
| title_fullStr | Coherence and statistical insights for low electron count regimes in transmission electron microscopy |
| title_full_unstemmed | Coherence and statistical insights for low electron count regimes in transmission electron microscopy |
| title_short | Coherence and statistical insights for low electron count regimes in transmission electron microscopy |
| title_sort | coherence and statistical insights for low electron count regimes in transmission electron microscopy |
| topic | Transmission electron microscope Speckle Coherent diffraction Low dose |
| url | https://doi.org/10.1186/s40543-025-00503-2 |
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