Coherence and statistical insights for low electron count regimes in transmission electron microscopy
Abstract We investigate coherent diffraction patterns from an amorphous SiO $$_2$$ 2 across a range of electron counting regimes, from sparse single-event detection to cumulative high-flux exposures. Low electron count rates, with a mean of approximately 0.017 electrons per pixel, reveal discrete el...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2025-07-01
|
| Series: | Journal of Analytical Science and Technology |
| Subjects: | |
| Online Access: | https://doi.org/10.1186/s40543-025-00503-2 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|