APA (7th ed.) Citation

Lee, J., Kwon, J., & Lee, S. Coherence and statistical insights for low electron count regimes in transmission electron microscopy. SpringerOpen.

Chicago Style (17th ed.) Citation

Lee, Joohyun, Ji-Hwan Kwon, and Sooheyong Lee. Coherence and Statistical Insights for Low Electron Count Regimes in Transmission Electron Microscopy. SpringerOpen.

MLA (9th ed.) Citation

Lee, Joohyun, et al. Coherence and Statistical Insights for Low Electron Count Regimes in Transmission Electron Microscopy. SpringerOpen.

Warning: These citations may not always be 100% accurate.