A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions
This article presents a novel method for accurate online extraction of semiconductor ON-state resistance in the presence of measurement noise. In this method, the ON-state resistance value is extracted from the measured ON-state voltage of the semiconductors and the measured load current. The extrac...
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Main Authors: | Mohsen Asoodar, Mehrdad Nahalparvari, Simon Schneider, Iman Shafikhani, Gunnar Ingestrom, Hans-Peter Nee |
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Format: | Article |
Language: | English |
Published: |
IEEE
2024-01-01
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Series: | IEEE Open Journal of Instrumentation and Measurement |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10479961/ |
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