A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions
This article presents a novel method for accurate online extraction of semiconductor ON-state resistance in the presence of measurement noise. In this method, the ON-state resistance value is extracted from the measured ON-state voltage of the semiconductors and the measured load current. The extrac...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10479961/ |
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