On the machinability threshold of dynamic lithography
In the realm of the tapping mode of atomic force microscopy (AFM), dynamic lithography emerges as a technique facilitating high-resolution surface nano-machining. However, the precise machinability threshold of this method remains elusive. To address this knowledge gap, the current study explores th...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-09-01
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| Series: | Journal of Materials Research and Technology |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785425018988 |
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