Helm, R., Egger, W., Corbel, C., Sperr, P., Butterling, M., Wagner, A., . . . Dickmann, M. Defect Studies in Thin-Film SiO<sub>2</sub> of a Metal-Oxide-Silicon Capacitor Using Drift-Assisted Positron Annihilation Lifetime Spectroscopy. MDPI AG.
Chicago Style (17th ed.) CitationHelm, Ricardo, et al. Defect Studies in Thin-Film SiO<sub>2</sub> of a Metal-Oxide-Silicon Capacitor Using Drift-Assisted Positron Annihilation Lifetime Spectroscopy. MDPI AG.
MLA (9th ed.) CitationHelm, Ricardo, et al. Defect Studies in Thin-Film SiO<sub>2</sub> of a Metal-Oxide-Silicon Capacitor Using Drift-Assisted Positron Annihilation Lifetime Spectroscopy. MDPI AG.
Warning: These citations may not always be 100% accurate.