Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible Photodetectors

Abstract Visible‐light photodetectors (VPDs) garner significant attention due to their diverse applications in optical communication. However, conventional VPDs struggle to achieve both transparency and flexibility, limiting their use in emerging technologies. Hydrogenated amorphous silicon (a‐Si:H)...

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Main Authors: Ye‐ji Jeong, Kyeong‐jin Hyun, Hee‐Won Jang, Jong‐won Yun, Yong‐Hun Kim, Woon Ik Park, Soo‐Won Choi, Jung‐Dae Kwon
Format: Article
Language:English
Published: Wiley 2025-08-01
Series:Advanced Science
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Online Access:https://doi.org/10.1002/advs.202504199
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author Ye‐ji Jeong
Kyeong‐jin Hyun
Hee‐Won Jang
Jong‐won Yun
Yong‐Hun Kim
Woon Ik Park
Soo‐Won Choi
Jung‐Dae Kwon
author_facet Ye‐ji Jeong
Kyeong‐jin Hyun
Hee‐Won Jang
Jong‐won Yun
Yong‐Hun Kim
Woon Ik Park
Soo‐Won Choi
Jung‐Dae Kwon
author_sort Ye‐ji Jeong
collection DOAJ
description Abstract Visible‐light photodetectors (VPDs) garner significant attention due to their diverse applications in optical communication. However, conventional VPDs struggle to achieve both transparency and flexibility, limiting their use in emerging technologies. Hydrogenated amorphous silicon (a‐Si:H) offers a promising platform for flexible optoelectronics for compatibility with substrates, although temperature reduction causes degradation of electrical and optical properties due to insufficient hydrogen passivation. In this study, the effect of the hydrogen‐to‐silane (H2/SiH4; f ratio) gas is systematically investigated ratio on the microstructural, optical, and electrical properties of a‐Si:H films synthesized at an ultra‐low temperature of 90 °C using plasma‐enhanced chemical vapor deposition (PECVD). Raman and Fourier‐transform infrared (FT‐IR) spectroscopy reveal that an optimized H2/SiH4 ratio minimizes Si─H2 bonding, effectively reducing defect density and improving film stability. Spectroscopic ellipsometry confirms that this ratio optimizes the refractive index and optical bandgap, enhancing light absorption. Electrical measurements demonstrate that photodiodes with the optimized a‐Si:H layer exhibit superior photosensitivity and suppressed dark current (f2: 20.6 and f8: 2.70 × 10−10 A, respectively), attributed to improved carrier transport and reduced Shockley–Read–Hall (SRH) recombination. Furthermore, flexible photodetectors maintain high mechanical reliability under repeated bending cycles. These findings highlight the potential of ultra‐low‐temperature PECVD a‐Si:H films for high‐performance, flexible photodetectors.
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spelling doaj-art-40eea75a9b4c4e88a8f04cf7fe221d2e2025-08-23T14:13:12ZengWileyAdvanced Science2198-38442025-08-011231n/an/a10.1002/advs.202504199Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible PhotodetectorsYe‐ji Jeong0Kyeong‐jin Hyun1Hee‐Won Jang2Jong‐won Yun3Yong‐Hun Kim4Woon Ik Park5Soo‐Won Choi6Jung‐Dae Kwon7Energy & Environment Materials Division Korea Institute of Materials Science Changwon Gyeongnam 51508 Republic of KoreaEnergy & Environment Materials Division Korea Institute of Materials Science Changwon Gyeongnam 51508 Republic of KoreaEnergy & Environment Materials Division Korea Institute of Materials Science Changwon Gyeongnam 51508 Republic of KoreaEnergy & Environment Materials Division Korea Institute of Materials Science Changwon Gyeongnam 51508 Republic of KoreaEnergy & Environment Materials Division Korea Institute of Materials Science Changwon Gyeongnam 51508 Republic of KoreaDepartment of Materials Science and Engineering Pukyong National University Busan 48513 Republic of KoreaEnergy & Environment Materials Division Korea Institute of Materials Science Changwon Gyeongnam 51508 Republic of KoreaEnergy & Environment Materials Division Korea Institute of Materials Science Changwon Gyeongnam 51508 Republic of KoreaAbstract Visible‐light photodetectors (VPDs) garner significant attention due to their diverse applications in optical communication. However, conventional VPDs struggle to achieve both transparency and flexibility, limiting their use in emerging technologies. Hydrogenated amorphous silicon (a‐Si:H) offers a promising platform for flexible optoelectronics for compatibility with substrates, although temperature reduction causes degradation of electrical and optical properties due to insufficient hydrogen passivation. In this study, the effect of the hydrogen‐to‐silane (H2/SiH4; f ratio) gas is systematically investigated ratio on the microstructural, optical, and electrical properties of a‐Si:H films synthesized at an ultra‐low temperature of 90 °C using plasma‐enhanced chemical vapor deposition (PECVD). Raman and Fourier‐transform infrared (FT‐IR) spectroscopy reveal that an optimized H2/SiH4 ratio minimizes Si─H2 bonding, effectively reducing defect density and improving film stability. Spectroscopic ellipsometry confirms that this ratio optimizes the refractive index and optical bandgap, enhancing light absorption. Electrical measurements demonstrate that photodiodes with the optimized a‐Si:H layer exhibit superior photosensitivity and suppressed dark current (f2: 20.6 and f8: 2.70 × 10−10 A, respectively), attributed to improved carrier transport and reduced Shockley–Read–Hall (SRH) recombination. Furthermore, flexible photodetectors maintain high mechanical reliability under repeated bending cycles. These findings highlight the potential of ultra‐low‐temperature PECVD a‐Si:H films for high‐performance, flexible photodetectors.https://doi.org/10.1002/advs.202504199defect passivationflexible electronicshydrogenated amorphous siliconlow temperaturesphotodetectors
spellingShingle Ye‐ji Jeong
Kyeong‐jin Hyun
Hee‐Won Jang
Jong‐won Yun
Yong‐Hun Kim
Woon Ik Park
Soo‐Won Choi
Jung‐Dae Kwon
Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible Photodetectors
Advanced Science
defect passivation
flexible electronics
hydrogenated amorphous silicon
low temperatures
photodetectors
title Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible Photodetectors
title_full Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible Photodetectors
title_fullStr Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible Photodetectors
title_full_unstemmed Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible Photodetectors
title_short Tailoring Hydrogenation to Enhance Defect Suppression and Charge Transport in Hydrogenated Amorphous Silicon for Flexible Photodetectors
title_sort tailoring hydrogenation to enhance defect suppression and charge transport in hydrogenated amorphous silicon for flexible photodetectors
topic defect passivation
flexible electronics
hydrogenated amorphous silicon
low temperatures
photodetectors
url https://doi.org/10.1002/advs.202504199
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