Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser

Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser

Angle-resolved photoelectron spectrometers with microchannel plate detectors and fast digitizer electronics are versatile and powerful devices for providing non-invasive single-shot photon diagnostics at a MHz repetition rate X-ray free-electron lasers. In this contribution, we demonstrate and chara...

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Bibliographic Details
Main Authors: Joakim Laksman, Florian Dietrich, Theophilos Maltezopoulos, Jia Liu, Danilo Enoque Ferreira de Lima, Natalia Gerasimova, Ivars Karpics, Naresh Kujala, Philipp Schmidt, Suren Karabekyan, Svitozar Serkez, Jan Grünert
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Applied Sciences
Subjects:
photon diagnostics
photoelectron spectrometer
polarimetry
X-ray
free electron laser
Online Access:https://www.mdpi.com/2076-3417/14/22/10152
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