Fabrication of Large-Area High-Resolution Templates by Focused Ion Beam Combined with Colloidal Nanoparticle Dimer Deposition for SERS Substrates
This article presents an examination of well-controlled patterns created using a Ga<sup>+</sup>-based focused ion beam (FIB) on glass, while silicon substrates were used to evaluate the FIB performance by its achievable feature size versus time constraints. The pattern creation on glass...
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| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-11-01
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| Series: | Nanomaterials |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-4991/14/22/1784 |
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