Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination

The analysis of the relation of fields generated at a tip and a contacting surface is performed in the Rayleigh approximation of a simple dipole model for the standard configuration of tip-enhanced Raman scattering experiments with external excitation. A comparison of the present results with the pr...

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Main Author: E. Bortchagovsky
Format: Article
Language:English
Published: Wiley 2018-01-01
Series:Journal of Nanotechnology
Online Access:http://dx.doi.org/10.1155/2018/3898524
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author E. Bortchagovsky
author_facet E. Bortchagovsky
author_sort E. Bortchagovsky
collection DOAJ
description The analysis of the relation of fields generated at a tip and a contacting surface is performed in the Rayleigh approximation of a simple dipole model for the standard configuration of tip-enhanced Raman scattering experiments with external excitation. A comparison of the present results with the previous ones obtained for the case of tip-source reveals the role of tip-surface configuration as the amplifier of the exciting field and the stronger influence of roughness on the field distribution at external illumination, as roughness is directly excited by the external field producing second source of field in addition to the tip.
format Article
id doaj-art-3793f73549c14a409b4fa9cd63b54368
institution Kabale University
issn 1687-9503
1687-9511
language English
publishDate 2018-01-01
publisher Wiley
record_format Article
series Journal of Nanotechnology
spelling doaj-art-3793f73549c14a409b4fa9cd63b543682025-02-03T05:47:09ZengWileyJournal of Nanotechnology1687-95031687-95112018-01-01201810.1155/2018/38985243898524Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External IlluminationE. Bortchagovsky0Institute of Semiconductor Physics of NAS of Ukraine, Pr.Nauki 41, Kyiv 03028, UkraineThe analysis of the relation of fields generated at a tip and a contacting surface is performed in the Rayleigh approximation of a simple dipole model for the standard configuration of tip-enhanced Raman scattering experiments with external excitation. A comparison of the present results with the previous ones obtained for the case of tip-source reveals the role of tip-surface configuration as the amplifier of the exciting field and the stronger influence of roughness on the field distribution at external illumination, as roughness is directly excited by the external field producing second source of field in addition to the tip.http://dx.doi.org/10.1155/2018/3898524
spellingShingle E. Bortchagovsky
Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination
Journal of Nanotechnology
title Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination
title_full Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination
title_fullStr Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination
title_full_unstemmed Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination
title_short Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination
title_sort simple modeling of the ratio of fields at a tip and a contacting surface with external illumination
url http://dx.doi.org/10.1155/2018/3898524
work_keys_str_mv AT ebortchagovsky simplemodelingoftheratiooffieldsatatipandacontactingsurfacewithexternalillumination