In-hive flatbed scanners for non-destructive, long-term monitoring of honey bee brood, pathogens and pests
Honey bee colonies face significant threats from pathogens and pests, including chalkbrood disease caused by Ascosphaera apis and Varroa destructor mites. Traditional monitoring methods for these issues are often destructive, hindering continuous and detailed observations. This study introduces a no...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2024-12-01
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| Series: | Smart Agricultural Technology |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2772375524002600 |
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