Ultra-fast light-field microscopy with event detection
Abstract The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2024-11-01
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| Series: | Light: Science & Applications |
| Online Access: | https://doi.org/10.1038/s41377-024-01603-1 |
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| _version_ | 1846171582341316608 |
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| author | Liheng Bian Xuyang Chang Hanwen Xu Jun Zhang |
| author_facet | Liheng Bian Xuyang Chang Hanwen Xu Jun Zhang |
| author_sort | Liheng Bian |
| collection | DOAJ |
| description | Abstract The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium. |
| format | Article |
| id | doaj-art-3340092f72e643f3b43b2c6803cc4f0a |
| institution | Kabale University |
| issn | 2047-7538 |
| language | English |
| publishDate | 2024-11-01 |
| publisher | Nature Publishing Group |
| record_format | Article |
| series | Light: Science & Applications |
| spelling | doaj-art-3340092f72e643f3b43b2c6803cc4f0a2024-11-10T12:43:05ZengNature Publishing GroupLight: Science & Applications2047-75382024-11-011311410.1038/s41377-024-01603-1Ultra-fast light-field microscopy with event detectionLiheng Bian0Xuyang Chang1Hanwen Xu2Jun Zhang3State Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing, Beijing Institute of TechnologyState Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing, Beijing Institute of TechnologyState Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing, Beijing Institute of TechnologyState Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing, Beijing Institute of TechnologyAbstract The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.https://doi.org/10.1038/s41377-024-01603-1 |
| spellingShingle | Liheng Bian Xuyang Chang Hanwen Xu Jun Zhang Ultra-fast light-field microscopy with event detection Light: Science & Applications |
| title | Ultra-fast light-field microscopy with event detection |
| title_full | Ultra-fast light-field microscopy with event detection |
| title_fullStr | Ultra-fast light-field microscopy with event detection |
| title_full_unstemmed | Ultra-fast light-field microscopy with event detection |
| title_short | Ultra-fast light-field microscopy with event detection |
| title_sort | ultra fast light field microscopy with event detection |
| url | https://doi.org/10.1038/s41377-024-01603-1 |
| work_keys_str_mv | AT lihengbian ultrafastlightfieldmicroscopywitheventdetection AT xuyangchang ultrafastlightfieldmicroscopywitheventdetection AT hanwenxu ultrafastlightfieldmicroscopywitheventdetection AT junzhang ultrafastlightfieldmicroscopywitheventdetection |