Ultra-fast light-field microscopy with event detection

Abstract The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.

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Bibliographic Details
Main Authors: Liheng Bian, Xuyang Chang, Hanwen Xu, Jun Zhang
Format: Article
Language:English
Published: Nature Publishing Group 2024-11-01
Series:Light: Science & Applications
Online Access:https://doi.org/10.1038/s41377-024-01603-1
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