Few-Shot Metric Learning with Time-Frequency Fusion for Specific Emitter Identification
Specific emitter identification (SEI) is a promising physical-layer authentication technique that serves as a crucial complement to upper-layer authentication mechanisms. SEI capitalizes on the inherent radio frequency fingerprints stemming from circuit discrepancies, which are intrinsic hardware pr...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-12-01
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| Series: | Remote Sensing |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-4292/16/24/4635 |
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