Stability and Performance Characterization of Thick Film Microresistors
In recent years, interest in the performance of small dimension resistors has increased primarily due to the need to reduce parasitic resistance in high frequency applications. This paper presents results on the characterization of thick film microresistors, i.e. resistors of 80 × 80 mil to 10 × 10...
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| Main Author: | |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1987-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1987/61728 |
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