Spontaneous Cooling Enables High‐Quality Perovskite Wafers for High‐Sensitivity X‐Ray Detectors with a Low‐Detection Limit
Abstract Developing high‐quality perovskite wafers is essential for integrating perovskite technology throughout the chip industry chain. In this article, a spontaneous cooling strategy with a hot‐pressing technique is presented to develop high‐purity, wafer‐scale, pinhole‐free perovskite wafers wit...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2024-12-01
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| Series: | Advanced Science |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/advs.202410303 |
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